High-Resolution Imaging and Spectrometry of Materials
F. Ernst, W. Sigle (auth.), Prof. Dr. Frank Ernst, Prof. Dr.Dr.h.c. Manfred Rühle (eds.)This book gives a survey of and systematic introduction to high-resolution electron microscopy. The method is carefully discussed, the latest developments are reported, and the application to surface and interface analysis and to the study of hidden structures is presented. The book arises from research carried out at one of the world's leading centers of electron microscopy. It will appeal to researchers and advanced students.
Kategori:
Tahun:
2003
Edisi:
1
Penerbit:
Springer-Verlag Berlin Heidelberg
Bahasa:
english
Halaman:
442
ISBN 10:
3662077663
ISBN 13:
9783662077665
Nama siri:
Springer Series in Materials Science 50
Fail:
PDF, 15.14 MB
IPFS:
,
english, 2003
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